The CT-NANO is a fully operating scanning electron micro­scope with capabi­li­ties of Nano-CT measu­re­ments on specimen like light-metal-alloys and fiber composites.
It delivers Voxel-sizes in ranges from 30 nm to 10 μm, a geome­trical magni­fi­ca­tion up to 50nm (FWHM) and a maximum photon energy of 30 keV. An EDS-Detector provides an additional corre­la­tion between XRF signal of specimen and recon­s­tructed volume of the CT-NANO.

CT-NANO has the best resolu­tion avaible at the market at this energy level, which allowes to inspect materials or sructures which were not even possible before.


  • X‑ray Computed Tomography (nanoCT)
  • Scanning Electron Micro­scope (SEM)
  • Digital Radio­graphy (DR)
  • Energy-Disper­sive X‑ray spectro­scopy (EDX)
  • 3D volume CT
  • Non-destruc­tive testing (NDT) – 2D and 3D
  • Quality control indepen­dent of material
  • Defect recogni­tion (voids, cracks, …)
  • Radiation safety better than 1 µSv/h